Employing M1 direct calibration/de-embedding approaches for large signal model validation at mm-wave frequencies
Carmine De Martino (TU Delft - Electronics, Vertigo Technologies)
C. Esposito (Technische Universität Dresden)
Michael Schroter (Technische Universität Dresden)
M Spirito (TU Delft - Electronics)
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Abstract
In this contribution, we employ direct calibration/de-embedding approaches to validate the large signal device model of state-of-the-art HBTs and CMOS technologies operating in the mm-wave frequency band WR6. The capability of placing the first tier calibration reference plane in close proximity to the DUT allows the large signal metric to be directly compared with foundry models.