Study of the defect distribution in a-Si:H during degradation

Conference paper (2000)

Authors

JJG van Heuvel Electronic Components, Technology and Materials - EEMCS
M. Zeman Electronic Components, Technology and Materials - EEMCS
JW Metselaar Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2000

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials