Finite Element Analysis and Experimental Investigation of Die-attach Fillet Influence on the Reliability of Epoxy-Based Pressure-Less Sintered Silver Joints

Conference Paper (2025)
Author(s)

Xinyue Wang (Fudan University)

Haixue Chen (Fudan University)

Zhoudong Yang (Fudan University)

Jing Zhang (Heraeus Electronics)

Guoqi Zhang (TU Delft - Electronic Components, Technology and Materials)

Pan Liu (Fudan University)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/EuroSimE65125.2025.11006635
More Info
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Publication Year
2025
Language
English
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository as part of the Taverne amendment. More information about this copyright law amendment can be found at https://www.openaccess.nl. Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. @en
Publisher
IEEE
ISBN (electronic)
9798350393002
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Abstract

This work investigated the impact of die-attach fillet geometry on the reliability of epoxy-based pressure-less sintered silver joints. Three types of sintered silver samples (Ag-0, Ag-1, and Ag-2) with 0%, 1%, and 2% epoxy content were prepared and characterized. Nanoindentation tests combined with inverse calculations were used to determine their elasto-plastic behavior. Fillet formation was influenced by organic solvent composition, dispense volume, and placement pressure, resulting in three geometries: rounded, triangular, and rounded rectangular. Finite element analysis was employed to simulate stress distribution and equivalent thermal strain under thermal cycling conditions (−55°C to 150°C). The simulation results were validated experimentally through shear strength testing and microstructural characterization using scanning electron microscopy (SEM). The findings highlight the significant role of fillet geometry, climbing height, and die-attach thickness in stress distribution and failure mechanisms, providing valuable insights into optimizing the die-attach process to enhance joint reliability in power electronics applications.

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