Sample variability and time stability in scaled silicon nanowires.

Conference paper (2009)

Authors

M Pierre External organisation
X Jehl External organisation
GP Lansbergen QN/Photronic Devices
S. Rogge QN/Photronic Devices
M. Ruoff External organisation
M. Fleischer External organisation
D. Wharam External organisation
D. Kern External organisation
R. Wacquez External organisation
M. Vinet External organisation
M. Sanquer External organisation
M. Belli External organisation
E. Prati External organisation
M. Fanciulli External organisation
J. Verduijn QN/Photronic Devices
GC Tettamanzi QN/Photronic Devices
Research Group
QN/Photronic Devices
More Info
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Published Date

2009

Language

Undefined/Unknown

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Research Group

QN/Photronic Devices