Quantitative surface characterization using a Normarki microscope.
Conference Paper
(2000)
Author(s)
OW Fähnle (TU Delft - ImPhys/Optics)
S Debruyne (External organisation)
T Wons (External organisation)
RM van der Bijl (External organisation)
H van Brug (TU Delft - ImPhys/Optics)
Joseph Braat (TU Delft - ImPhys/Optics)
Research Group
ImPhys/Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:d10fc484-af45-4288-ab0d-c69d11f37e8f
More Info
expand_more
expand_more
Publication Year
2000
Research Group
ImPhys/Optics
Bibliographical Note
ODF2000; OSA Technical Digest series@en
Pages (from-to)
91-93
No files available
Metadata only record. There are no files for this record.