Quantitative surface characterization using a Normarki microscope.

Conference paper (2000)

Authors

OW Fähnle ImPhys/Optics - AS
S Debruyne External organisation
T Wons External organisation
RM van der Bijl External organisation
H van Brug ImPhys/Optics - AS
J.J.M. Braat ImPhys/Optics - AS
Research Group
ImPhys/Optics (AS) (TU Delft)
More Info
expand_more

Published Date

2000

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Optics