Logical fault detection of CMOS SRAM ICs based on write quiescent supply current
Journal Article
(1999)
Author(s)
M Hashizume (External organisation)
T Tamesada (External organisation)
T Koyama (External organisation)
AJ van de Goor Ph D (External organisation)
University
Delft University of Technology
To reference this document use:
https://resolver.tudelft.nl/uuid:d2be9f0b-4095-4267-a412-14b6b984c1dd
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Publication Year
1999
University
Delft University of Technology
Issue number
7
Volume number
82
Pages (from-to)
906-915
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