Metrics to Characterize Parallel Applications

Conference paper (2010)

Authors

A.S. van Amesfoort Data-Intensive Systems - EEMCS
A.L. Varbanescu Data-Intensive Systems - EEMCS
H.J. Sips Data-Intensive Systems - EEMCS
Research Group
Data-Intensive Systems (EEMCS) (TU Delft)
More Info
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Published Date

2010

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Software Technology

Research Group

Data-Intensive Systems