A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks

Journal article (2014)

Authors

A Barenghi External organisation
C Hocquet External organisation
D Bol External organisation
FX Standaert External organisation
F. Regazzoni Signal Processing Systems - EEMCS
I Koren External organisation
Research Group
Signal Processing Systems (EEMCS) (TU Delft)
Copyright: © 2014 A Barenghi, C Hocquet, D Bol, FX Standaert, F. Regazzoni, I Koren
DOI
help_outline
https://doi.org/10.1109/TETC.2014.2316509
More Info
expand_more

Published Date

2014

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems

Files

06797908.pdf
(.pdf | 3.69 Mb)