25th Anniversary of STED Microscopy and the 20th Anniversary of SIM
Feature introduction
Peter Kner (University of Georgia)
Suliana Manley (École Polytechnique Fédérale de Lausanne)
Yoav Shechtman (Technion Israel Institute of Technology)
S Stallinga (TU Delft - ImPhys/Imaging Physics)
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Abstract
This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.