Drift-Diffusion-Reaction Model for Time-Domain Analysis of Charging Phenomena in Electron-Beam Irradiated Insulators

Doctoral thesis (2018)

Authors

Behrouz Raftari Tangabi Numerical Analysis - EEMCS
Research Group
Numerical Analysis (EEMCS) (TU Delft)
Copyright: © 2018 Behrouz Raftari Tangabi
DOI: https://doi.org/10.4233/uuid:d823ad12-60ea-49d0-b8c0-0ccd1449387f
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Published Date

2018

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Delft Institute of Applied Mathematics

Research Group

Numerical Analysis

Abstract

Electron microscopes take advantage of a beam of electrons to illuminate a
specimen and extract the needed information from the interaction of particles
with matter in order to produce a high resolution image. The main research
question of the present study arose from the fact that this resolution is degraded
when a given specimen contains insulating materials. In the electron
microscopy of insulators the effect behind the degradation of an image resolution
is known as the charging effect. The charging effect needs to be studied
and understood, in particular, since biological specimens are either insulators
or contain insulating parts.

Files

Dissertation.pdf
(.pdf | 2.24 Mb)