Characterization of an x-ray phase contrast imaging system based on the miniature synchrotron MIRRORCLE-6X.
Journal Article
(2011)
Author(s)
RJ van Heekeren (TU Delft - ImPhys/Quantitative Imaging)
A Kostenko (TU Delft - ImPhys/Quantitative Imaging)
T Hanashima (External organisation)
H Yamada (External organisation)
Sjoerd Stallinga (TU Delft - ImPhys/Quantitative Imaging)
Sven Erik Offerman (TU Delft - OLD Metals Processing, Microstructures and Properties)
Lucas J Van Vliet (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:db17c98e-8796-48e1-b0c3-26718922e3af
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Publication Year
2011
Language
English
Research Group
ImPhys/Quantitative Imaging
Issue number
9
Volume number
38
Pages (from-to)
5136-5145
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