In-situ TEM studies of the electromigration process in a single InAs nanowire
Conference Paper
(2014)
Author(s)
M. Neklyudova (QN/High Resolution Electron Microscopy)
H.W. Zandbergen (QN/High Resolution Electron Microscopy)
QN/High Resolution Electron Microscopy
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Publication Year
2014
Language
English
QN/High Resolution Electron Microscopy
Pages (from-to)
1-2
ISBN (print)
978-80-260-6720-7
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