Far-infrared pump-probe measurement of the lifetime of the 2p(-1) shallow donor level in n-GaAs
Journal Article
(1996)
Author(s)
AJ Kalkman (TU Delft - QN/Fysics of NanoElectronics)
HPM Pellemans (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)
TO Klaassen (TU Delft - Old - sect Terahertz Imaging (IST/TI))
WT Wenckebach (TU Delft - Old - sect Terahertz Imaging (IST/TI))
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:de30036b-03ec-45bd-8d80-f2a514bc669b
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Publication Year
1996
Research Group
QN/Fysics of NanoElectronics
Volume number
17
Pages (from-to)
569-577
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