Confocal photoluminescence mapping of diamond photonic crystal cavity modes for the silicon vacancy center

Journal Article (2026)
Author(s)

Lin Jin (TU Delft - QuTech Advanced Research Centre, TU Delft - QID/Taminiau Lab, Universität Münster, Universität Heidelberg)

Mark Ulanov (Universität Heidelberg)

Stefan Dietel (University of Ulm and Geriatric Center Ulm/Alb-DonauAgaplesion Bethesda Hospital)

Lev Kazak (University of Ulm and Geriatric Center Ulm/Alb-DonauAgaplesion Bethesda Hospital)

Nicola Lang ( Fraunhofer Institute for Applied Solid State Physics (IAF))

Peter Knittel ( Fraunhofer Institute for Applied Solid State Physics (IAF))

Fedor Jelezko (University of Ulm and Geriatric Center Ulm/Alb-DonauAgaplesion Bethesda Hospital)

Wolfram Pernice (Universität Münster, Universität Heidelberg)

Research Institute
QuTech Advanced Research Centre
DOI related publication
https://doi.org/10.1364/OE.585152 Final published version
More Info
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Publication Year
2026
Language
English
Research Institute
QuTech Advanced Research Centre
Journal title
Optics Express
Issue number
7
Volume number
34
Pages (from-to)
12493-12506
Downloads counter
8
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Abstract

Diamond photonic crystal cavities offer exceptional properties for interfacing color centers in diamond to integrated photonic circuits. Leveraging Purcell enhancement of the color centers’ emission into the zero-phonon line, the development of high quality, low mode volume single-crystal diamond resonators remains one of the key challenges for building diamond quantum networks. In this paper, we present both a robust, versatile photonic crystal design as well as a scalable fabrication process realizing suspended nanobeam cavities. Measurements of confocal microscopy with broadband excitation yield quality factors of more than 5000. We further demonstrate a fast and facile characterization of our structures based on confocal photoluminescence imaging. This method not only provides a more detailed look at the higher order modes within diamond nanobeam resonators but also serves as a non-destructive diagnostic of the modes’ susceptibility to fabrication imperfections, providing critical feedback for scalable, high-yield integrated quantum photonic device development.

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