In situ environmental TEM studies using MEMS based devices

Malladi, S.R.K.; Basak, S.; Wu, M.; Xu, Q.; Erdamar, A.K.; Tichelaar, F.D.; Zandbergen, H.W.

In situ environmental TEM studies using MEMS based devices

Conference paper (2014)

Authors

S.R.K. Malladi QN/High Resolution Electron Microscopy

S. Basak QN/High Resolution Electron Microscopy

M. Wu QN/High Resolution Electron Microscopy

Q. Xu QN/High Resolution Electron Microscopy

A.K. Erdamar QN/High Resolution Electron Microscopy

F.D. Tichelaar QN/High Resolution Electron Microscopy

H.W. Zandbergen QN/High Resolution Electron Microscopy

Research Group

QN/High Resolution Electron Microscopy

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Published Date

2014

Language

English

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Research Group

QN/High Resolution Electron Microscopy