In situ environmental TEM studies using MEMS based devices

Malladi, SRK; Basak, S.; Wu, M.; Xu, Q.; Erdamar, A.K.; Tichelaar, Frans; Zandbergen, H.W.

In situ environmental TEM studies using MEMS based devices

Conference paper (2014)

Authors

SRK Malladi QN/High Resolution Electron Microscopy

S. Basak QN/High Resolution Electron Microscopy

M. Wu QN/High Resolution Electron Microscopy

Q. Xu QN/High Resolution Electron Microscopy

A.K. Erdamar QN/High Resolution Electron Microscopy

Frans Tichelaar QN/High Resolution Electron Microscopy

H.W. Zandbergen QN/High Resolution Electron Microscopy

Research Group

QN/High Resolution Electron Microscopy

To reference this document use:

http://resolver.tudelft.nl/uuid:e448bbcb-b47c-4dd3-b761-78086f72ca4d

More Info

expand_more

Published Date

2014

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

QN/High Resolution Electron Microscopy

No files available

Metadata only record. There are no files for this conference paper.