Application of positron beams for the characterization of nano-scale pores in thin films

Hirata, K; Ito, K; Kobayashi, Y.; Suzuki, R; Ohdaira, T; Eijt, SWH; Schut, H.; van Veen, A

Application of positron beams for the characterization of nano-scale pores in thin films

Conference paper (2003)

Authors

K Hirata External organisation

K Ito External organisation

Y. Kobayashi External organisation

R Suzuki External organisation

T Ohdaira External organisation

SWH Eijt Old - Section Defects in Materials

H. Schut Old - Section Defects in Materials

A van Veen Old - Section Defects in Materials

Research Group

Old - Section Defects in Materials

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Published Date

2003

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Research Group

Old - Section Defects in Materials

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