Application of positron beams for the characterization of nano-scale pores in thin films
Conference Paper
(2003)
Author(s)
K Hirata (External organisation)
K Ito (External organisation)
Y. Kobayashi (External organisation)
R Suzuki (External organisation)
T Ohdaira (External organisation)
Stephan W.H. Eijt (TU Delft - Old - Section Defects in Materials)
H. Schut (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
Research Group
Old - Section Defects in Materials
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https://resolver.tudelft.nl/uuid:e5b84501-e439-4196-b14e-912833b9b4c7
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Publication Year
2003
Research Group
Old - Section Defects in Materials
Pages (from-to)
503-508
ISBN (print)
0-7354-0149-7
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