Application of positron beams for the characterization of nano-scale pores in thin films

Conference paper (2003)

Authors

K Hirata External organisation
K Ito External organisation
Y. Kobayashi External organisation
R Suzuki External organisation
T Ohdaira External organisation
S.W.H. Eijt Old - Section Defects in Materials
H. Schut Old - Section Defects in Materials
A van Veen Old - Section Defects in Materials
Research Group
Old - Section Defects in Materials
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Published Date

2003

Language

Undefined/Unknown

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Research Group

Old - Section Defects in Materials