Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending
Conference Paper
(2002)
Author(s)
R Escobar Galindo (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
H. Schut (TU Delft - Old - Section Defects in Materials)
NJM Carvalho (External organisation)
C Strondl (External organisation)
ThM Hosson (External organisation)
Research Group
Old - Section Defects in Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:e5c449fd-f7b1-4358-9e17-5eafc787a338
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Publication Year
2002
Research Group
Old - Section Defects in Materials
Pages (from-to)
L9.4/ 1-6
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