Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending

Escobar Galindo, R; van Veen, A; Schut, Henk; Carvalho, NJM; Strondl, C; Hosson, ThM

Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending

Conference paper (2002)

Authors

R Escobar Galindo Old - Section Defects in Materials

A van Veen Old - Section Defects in Materials

Henk Schut Old - Section Defects in Materials

NJM Carvalho External organisation

C Strondl External organisation

ThM Hosson External organisation

Research Group

Old - Section Defects in Materials

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Published Date

2002

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Research Group

Old - Section Defects in Materials

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