Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending

Conference Paper (2002)
Author(s)

R Escobar Galindo (TU Delft - Old - Section Defects in Materials)

A van Veen (TU Delft - Old - Section Defects in Materials)

H. Schut (TU Delft - Old - Section Defects in Materials)

NJM Carvalho (External organisation)

C Strondl (External organisation)

ThM Hosson (External organisation)

Research Group
Old - Section Defects in Materials
More Info
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Publication Year
2002
Research Group
Old - Section Defects in Materials
Pages (from-to)
L9.4/ 1-6

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