An Efficient Method for Assessing Board Level Reliability for Micro-electronic Packages using Combined Experimental - Numerical Techniques
Conference Paper
(2006)
Author(s)
MY Jansen (External organisation)
JWC de Vries (External organisation)
Willem D. van Driel (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:e91e5c9f-bbb8-460e-843e-e5f79c5e138a
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Publication Year
2006
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
1-5
ISBN (print)
1-4244-0276X
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