X-ray radiation effects on CMOS image sensor in-pixel devices
Conference Paper
(2010)
Author(s)
J. Tan (TU Delft - Electronic Instrumentation)
B Buttgen (TU Delft - Electronic Instrumentation)
Albert Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:ea29bfa9-7282-42f3-82d2-04adee54bfb5
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Publication Year
2010
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
299-300
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