Testing (embedded) memories: new fault models, test, DfT, BIST, BISR, and industrial results

Conference paper (2003)

Authors

AJ van de Goor Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2003

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering