Time-frequency analysis of lifted and standard iterative learning control applied to the short stroke of a wafer stage test rig
Report
(2002)
Author(s)
I Rotariu (External organisation)
BG Dijkstra (TU Delft - DISC)
R Ellenbroek (External organisation)
M. Steinbuch (External organisation)
Research Group
DISC
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https://resolver.tudelft.nl/uuid:eb6982c9-c983-4bdf-8be4-1fd58486abe7
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Publication Year
2002
Research Group
DISC
Bibliographical Note
Confidential@en
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