Variation tolerant on-chip degradation sensors for dynamic reliability management systems
Journal Article
(2012)
Author(s)
Y. Wang (TU Delft - Computer Engineering)
M. Enachescu (TU Delft - Computer Engineering)
Shao Ku Kao Cotofana (TU Delft - Computer Engineering)
L Fang (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:ec8eea70-64c6-4143-86a9-b5db519cf3bd
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Issue number
9-10
Volume number
52
Pages (from-to)
1-6
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