MEMS for thermogravimetry: Fully integrated device for inspection of nanomasses

Journal article (2011)

Authors

E. Iervolino Old - EWI Sect. ECTM
AW van Herwaarden External organisation
W. van der Vlist Electronic Components, Technology and Materials - EEMCS
Pasqualina M Sarro Electronic Components, Technology and Materials - EEMCS
Research Group
Old - EWI Sect. ECTM
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Published Date

2011

Language

English

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Research Group

Old - EWI Sect. ECTM