MEMS for thermogravimetry: Fully integrated device for inspection of nanomasses
Journal Article
(2011)
Author(s)
E. Iervolino (TU Delft - Old - EWI Sect. ECTM)
AW van Herwaarden (External organisation)
W. van der Vlist (TU Delft - Electronic Components, Technology and Materials)
Pasqualina Sarro (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Sect. ECTM
To reference this document use:
https://resolver.tudelft.nl/uuid:f1144f62-59b0-4b51-85a4-5d970f5019c6
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Publication Year
2011
Language
English
Research Group
Old - EWI Sect. ECTM
Issue number
6
Volume number
20
Pages (from-to)
1277-1286
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