Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR
Journal Article
(2002)
Author(s)
Stephan Eijt (TU Delft - Old - Section Defects in Materials)
CV Falub (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
H. Schut (TU Delft - Old - Section Defects in Materials)
PE Mijnarends (TU Delft - Old - Section Defects in Materials)
Research Group
Old - Section Defects in Materials
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https://resolver.tudelft.nl/uuid:f1b4327a-edd1-41aa-9179-ee5d1f549e26
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Publication Year
2002
Research Group
Old - Section Defects in Materials
Volume number
194
Pages (from-to)
234-238
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