Degradation of spectral response and dark current of CMOS image sensor in deep-submicron technology due to gamma-irradiation
Conference Paper
(2007)
Author(s)
Rao padmakumar (External organisation)
X Wang (TU Delft - Electronic Instrumentation)
Albert J.P. Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:f2980cba-b08e-4944-b712-e34d64dce287
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Publication Year
2007
Research Group
Electronic Instrumentation
Pages (from-to)
370-373
ISBN (print)
1-4244-1123-8
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