In-situ electrical characterization combined with simultaneous TEM observation
Poster
(2010)
Author(s)
M. Rudneva (TU Delft - QN/High Resolution Electron Microscopy)
B Gao (TU Delft - QN/Mol. Electronics & Devices)
H. S.J. van der Zant (TU Delft - QN/Mol. Electronics & Devices)
Henny Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
QN/High Resolution Electron Microscopy
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Publication Year
2010
Language
English
Research Group
QN/High Resolution Electron Microscopy
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