In-situ electrical characterization combined with simultaneous TEM observation

Poster (2010)
Author(s)

M. Rudneva (TU Delft - QN/High Resolution Electron Microscopy)

B Gao (TU Delft - QN/Mol. Electronics & Devices)

H. S.J. van der Zant (TU Delft - QN/Mol. Electronics & Devices)

Henny Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)

Research Group
QN/High Resolution Electron Microscopy
More Info
expand_more
Publication Year
2010
Language
English
Research Group
QN/High Resolution Electron Microscopy

No files available

Metadata only record. There are no files for this record.