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Journal article (2020)

Authors

B. Yousefzadeh Electronic Instrumentation - EEMCS
K.A.A. Makinwa Microelectronics
Department
Microelectronics
Copyright: © 2020 B. Yousefzadeh, K.A.A. Makinwa
DOI
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https://doi.org/10.1109/JSSC.2019.2953834
Stress Calibration Calibration Temperature sensor BJT Temperature sensors System-on-chip Temperature distribution Heating systems Low leakage Heater-assisted On-chip heater Voltage calibration (VCAL)
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Published Date

2020

Language

English

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Department

Microelectronics

Abstract

This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 °C. This, in turn, enables VCAL at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16- mu text {m} standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm2 and operates from 1.8 V.