Column-Parallel Single Slope ADC with Digital Correlated Multiple Sampling for Low Noise CMOS Image Sensors
Journal Article
(2011)
Author(s)
Yue Chen (TU Delft - Electronic Instrumentation)
A.J.P.A.M. Theuwissen (TU Delft - Electronic Instrumentation)
Y. Chae (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:f703cf36-edee-4dab-ac5f-9e7043cbcf62
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Publication Year
2011
Language
English
Research Group
Electronic Instrumentation
Volume number
25
Pages (from-to)
1265-1268
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