Defect states in excimer-laser crystallized single-grain TFTs studied with isothermal charge deep-level transient spectroscopy
Conference Paper
(2006)
Author(s)
V Nadazdy (TU Delft - Electronic Components, Technology and Materials)
V Rana (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
S Lanyi (External organisation)
R Durny (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:f863267d-82a2-41af-8197-a21ae404677d
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Publication Year
2006
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
-
ISBN (print)
978-1-55899-866
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