Optimal Co-Design of Sensor Placement and State Observer for Lithography Applications

Conference Paper (2025)
Author(s)

R. P.P.F. Goetz (Eindhoven University of Technology)

N. Van De Wouw (Eindhoven University of Technology)

T. Oomen (TU Delft - Mechanical Engineering, Eindhoven University of Technology)

M. M.J. Van De Wal (ASML)

B. Sharif (ASML)

H. J. Zwart (Student TU Delft)

Research Group
Team Jan-Willem van Wingerden
DOI related publication
https://doi.org/10.1109/CCTA53793.2025.11151477 Final published version
More Info
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Publication Year
2025
Language
English
Research Group
Team Jan-Willem van Wingerden
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/publishing/publisher-deals Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Pages (from-to)
321-326
Publisher
IEEE
ISBN (electronic)
979-8-3315-3908-5
Event
9th IEEE Conference on Control Technology and Applications, CCTA 2025 (2025-08-25 - 2025-08-27), San Diego, United States
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Abstract

The state and output estimation accuracy depends on both the observer and the sensor locations. This paper focuses on this co-design problem in lithography applications. A theoretical formulation of this co-design problem is presented and solved for discrete-time linear stochastic models. We compare the optimal solution of two variants of the estimation problem. The first variant minimizes the transient estimation error whereas the second one minimizes the steady-state estimation error. In both cases, the Kalman filter is optimal. While solving these problems for a lithography application formulated as a 3D thermoelastic model, we observe a significant difference between the optimal sensor placements. Our results highlight the importance of designing a sensor layout in line with the desired transient or steady-state estimation performance.

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