Angular dependence of the ion-induced secondary electron emission for He(+) and Ga(+) beams
Journal Article
(2011)
Author(s)
V Castaldo (TU Delft - ImPhys/Charged Particle Optics)
J Winthagen (External organisation)
Kees Hagen (TU Delft - ImPhys/Charged Particle Optics)
Research Group
ImPhys/Charged Particle Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:fbaaa958-de3f-429b-a46c-67ce0bbda55e
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Publication Year
2011
Research Group
ImPhys/Charged Particle Optics
Issue number
4
Volume number
17
Pages (from-to)
624-636
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