Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation
Journal Article
(2008)
Author(s)
Rao padmakumar (External organisation)
X Wang (TU Delft - Electronic Instrumentation)
Albert J.P. Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:fbb4f8d6-a837-4d92-b4c4-e34c6ac36f43
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Publication Year
2008
Research Group
Electronic Instrumentation
Volume number
52
Pages (from-to)
1407-1413
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