Extraction of the defect density of states of a-Si:H using Q-DLTS
Conference Paper
(2005)
Author(s)
BE Pieters (TU Delft - Electronic Components, Technology and Materials)
M. Zeman (TU Delft - Electronic Components, Technology and Materials)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:ffdace42-50ca-41b3-b815-b78872363449
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Editor onbekend, WPM/STW@en
Pages (from-to)
38-42
ISBN (print)
90-73461-50-2
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