Print Email Facebook Twitter Spontaneous resistance switching and low-frequency noise in quantum point contacts Title Spontaneous resistance switching and low-frequency noise in quantum point contacts Author Dekker, C. Scholten, A.J. Liefrink, F. Eppenga, R. Van Houten, H. Foxon, C.T. Date 1991-04-22 Subject A7220J Charge carriers: generation, recombination, lifetime, and trapping semiconductors/insulatorsA7270 Noise processes and phenomena in electronic transportA7320D Electron states in low dimensional structuresA7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctionscarrier mobilitycharge transportconductanceelectron device noiseelectron trapselectrostatic potentialfrequency dependenceINSPEClocal electrostatic potentiallow frequency noiselow frequency noise spectroscopymodelnoisepoint contactsquantum point contactquantum point contactsquantum size effectresistanceresistance switchingsemiconductor quantum dotssemiconductorssize effectspectral densitytemperature dependencetransporttrappingwhite noise To reference this document use: http://resolver.tudelft.nl/uuid:06a694bc-6bdc-4bf3-9014-8eeac94a7623 ISSN 0031-9007 Source Physical Review Letters 66(16), 2148-2151. (1991) Part of collection Institutional Repository Document type journal article Files PDF 868485.pdf 293.84 KB Close viewer /islandora/object/uuid:06a694bc-6bdc-4bf3-9014-8eeac94a7623/datastream/OBJ/view