Print Email Facebook Twitter N-bit Data Parallel Spin Wave Logic Gate Title N-bit Data Parallel Spin Wave Logic Gate Author Mahmoud, A.N.N. (TU Delft Computer Engineering) Vanderveken, Frederic (IMEC) Ciubotaru, Florin (IMEC) Adelmann, Christoph (IMEC) Cotofana, S.D. (TU Delft Computer Engineering) Hamdioui, S. (TU Delft Quantum & Computer Engineering) Contributor Di Natale, Giorgio (editor) Bolchini, Cristiana (editor) Vatajelu, Elena-Ioana (editor) Department Quantum & Computer Engineering Date 2020 Abstract Due to their very nature, Spin Waves (SWs) created in the same waveguide, but with different frequencies, can coexist while selectively interacting with their own species only. The absence of inter-frequency interferences isolates input data sets encoded in SWs with different frequencies and creates the premises for simultaneous data parallel SW based processing without hardware replication or delay overhead. In this paper we leverage this SW property by introducing a novel computation paradigm, which allows for the parallel processing of n-bit input data vectors on the same basic SW based logic gate. Subsequently, to demonstrate the proposed concept, we present 8-bit parallel 3-input Majority gate implementation and validate it by means of Object Oriented MicroMagnetic Framework (OOMMF) simulations. To evaluate the potential benefit of our proposal we compare the 8-bit data parallel gate with equivalent scalar SW gate based implementation. Our evaluation indicates that 8-bit data 3-input Majority gate implementation requires 4.16x less area than the scalar SW gate based equivalent counterpart while preserving the same delay and energy consumption figures. Subject AreaData ParallelismDelayEnergyLogic GateMulti-frequencySpin-wave ComputingSpin-waves To reference this document use: http://resolver.tudelft.nl/uuid:2d7d5e31-026d-4619-a40b-ef6d648fff60 DOI https://doi.org/10.23919/DATE48585.2020.9116368 Publisher IEEE ISBN 978-1-7281-4468-9 Source 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings Event 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, 2020-03-09 → 2020-03-13, Grenoble, France Bibliographical note Accepted Author Manuscript Part of collection Institutional Repository Document type conference paper Rights © 2020 A.N.N. Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, S.D. Cotofana, S. Hamdioui Files PDF DATE2020_preprint.pdf 663.85 KB Close viewer /islandora/object/uuid:2d7d5e31-026d-4619-a40b-ef6d648fff60/datastream/OBJ/view