Title
Recent Trends and Perspectives on Defect-Oriented Testing
Author
Bernardi, P. (Politecnico di Torino)
Cantoro, R. (Politecnico di Torino)
Coyette, A. (Onsemi)
Dobbeleare, W. (Onsemi)
Fieback, M. (TU Delft Quantum & Computer Engineering; TU Delft Computer Engineering) 
Floridia, A. (STMicroelectronics)
Gielenk, G. (Katholieke Universiteit Leuven)
Guerriero, A. M. (Infineon Technologies AG)
Hamdioui, S. (TU Delft Quantum & Computer Engineering)
Contributor
Savino, Alessandro (editor)
Rech, Paolo (editor)
Di Carlo, Stefano (editor)
Gizopoulos, Dimitris (editor)
Department
Quantum & Computer Engineering
Date
2022
Abstract
Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test.
Subject
cell-aware test
data analytics
device-aware test
DPPB
DPPM
emerging technologies
Flash
non-volatile memories
visual inspection
To reference this document use:
http://resolver.tudelft.nl/uuid:3a021470-c1a1-4ec1-8a73-6fc72e8cc62d
DOI
https://doi.org/10.1109/IOLTS56730.2022.9897647
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Embargo date
2023-07-01
ISBN
9781665473552
Source
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
Event
28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, 2022-09-12 → 2022-09-14, Torino, Italy
Series
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Part of collection
Institutional Repository
Document type
conference paper
Rights
© 2022 P. Bernardi, R. Cantoro, A. Coyette, W. Dobbeleare, M. Fieback, A. Floridia, G. Gielenk, A. M. Guerriero, S. Hamdioui, More Authors