Print Email Facebook Twitter A ±4A high-side current sensor with 25V input CM range and 0.9% gain error from -40°C to 85°C using an analog temperature compensation technique Title A ±4A high-side current sensor with 25V input CM range and 0.9% gain error from -40°C to 85°C using an analog temperature compensation technique Author Xu, L. (TU Delft Electronic Instrumentation) Huijsing, J.H. (TU Delft Electronic Instrumentation) Makinwa, K.A.A. (TU Delft Microelectronics) Contributor Fujino, L.C. (editor) Department Microelectronics Date 2018 Abstract This paper presents a fully integrated ±4A current sensor that supports a 25V input common-mode voltage range (CMVR) while operating from a single 1.5V supply. It consists of an on-chip metal shunt, a beyond-the-rails ADC [1] and a temperature-dependent voltage reference. The beyond-the-rails ADC facilitates high-side current sensing without the need for external resistive dividers or level shifters, thus reducing power consumption and system complexity. To compensate for the shunt's temperature dependence, the ADC employs a proportional-to-absolute-temperature (PTAT) reference voltage. Compared to digital temperature compensation schemes [2,3], this analog scheme eliminates the need for a temperature sensor, a band-gap voltage reference and calibration logic. As a result, the current sensor draws only 10.9μA and is 10x more energy efficient than [2]. Over a ±4A range, and after a one-point trim, the sensor exhibits a 0.9% (max) gain error from -40°C to 85°C and a 0.05% gain error at room temperature. The former is comparable with that of other fully-integrated current sensors [2-4], while the latter represents the state-of-the-art. Subject Temperature sensorsTemperature distributionCapacitorsTemperature dependenceTemperature measurementMetals To reference this document use: http://resolver.tudelft.nl/uuid:98d57675-6081-4c7a-8839-2bb04f74c584 DOI https://doi.org/10.1109/ISSCC.2018.8310315 Publisher IEEE, Lewiston, USA Embargo date 2022-03-30 ISBN 978-1-5386-2227-8 Source 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018: Digest of Technical Papers, 61 Event 65th IEEE International Solid-State Circuits Conference, ISSCC 2018, 2018-02-11 → 2018-02-15, San Francisco, United States Bibliographical note Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. Part of collection Institutional Repository Document type conference paper Rights © 2018 L. Xu, J.H. Huijsing, K.A.A. Makinwa Files PDF 08310315.pdf 861.5 KB Close viewer /islandora/object/uuid:98d57675-6081-4c7a-8839-2bb04f74c584/datastream/OBJ/view