In-situ transmission electron microscopy at pressures above 1 bar and elevated temperatures

Title

In-situ transmission electron microscopy at pressures above 1 bar and elevated temperatures

Author

Zandbergen, H.W.

Faculty

Applied Sciences

Department

Quantum Nanoscience

Date

2012-11-23

To reference this document use:

http://resolver.tudelft.nl/uuid:ab615b2a-4118-4ca3-8446-189d6a356804

DOI

https://doi.org/10.1017/S1431927612007428

Publisher

Cambridge University Press

Embargo date

2013-11-23

ISSN

1435-8115

Source

http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8759050

Source

Microscopy and Microanalysis, 18 (supplement S2), 2012

Part of collection

Institutional Repository

Document type

journal article

Rights

(c) 2012 Microscopy and Microanalysis
Cambridge University Press