Print Email Facebook Twitter Electroluminescence and Dark Lock-In Thermography for the Quality Assessment of Metal-Wrap-Through Solar Devices Title Electroluminescence and Dark Lock-In Thermography for the Quality Assessment of Metal-Wrap-Through Solar Devices Author Ruggeri, Edoardo (University of Cambridge) van Aken, Bas (ECN, Petten) Isabella, O. (TU Delft Photovoltaic Materials and Devices) Zeman, M. (TU Delft Electrical Sustainable Energy) Department Electrical Sustainable Energy Date 2018 Abstract Imaging techniques, like electroluminescence and dark lock-in thermography, are valuable quality control tools as they yield quantitative and spatially resolved information about the device. In this paper, we isolated some of the conductive foil–cell interconnections of back-contact solar cells to study the appearance of these intentional failures in electroluminescence, dark lock-in thermography, and series resistance images. It has been found that isolated emitter-to-foil contacts are clearly visible in the three imaging techniques, as they show characteristic features that deviate from the features typical of functioning emitter-to-foil dots. Isolated base-to-foil contacts are instead invisible in the images obtained by electroluminescence and only hardly visible in the images obtained by the other two techniques. Only after a large amount of contacts are isolated, a local current redistribution or drastic series resistance increase is noticeable. Two graphical methods for the automatic identification of isolated emitter-to-foil contacts in electroluminescence, dark lock-in thermography, and series resistance images were also designed, showing a success rate of 97% in the investigated cells. Such techniques could represent useful tools for implementation in inline quality control processes. Moreover, the techniques and conclusions drawn in this paper can be extended to a large number of other conventional and emerging photovoltaic technologies. Subject Electrical resistance measurementelectroluminescencefailure analysisinfrared imagingradiation imagingsolar energy To reference this document use: http://resolver.tudelft.nl/uuid:b9ca8466-ce5f-45fa-8f6a-b081b215272c DOI https://doi.org/10.1109/JPHOTOV.2018.2850530 ISSN 2156-3381 Source IEEE Journal of Photovoltaics, 8 (5), 1174-1182 Part of collection Institutional Repository Document type journal article Rights © 2018 Edoardo Ruggeri, Bas van Aken, O. Isabella, M. Zeman Files PDF 46295442_2018_IEEE_JPV_Ru ... _cells.pdf 4.22 MB Close viewer /islandora/object/uuid:b9ca8466-ce5f-45fa-8f6a-b081b215272c/datastream/OBJ/view