Print Email Facebook Twitter A Novel Defect Diagnosis Method for Kyropoulos Process Based Sapphire Growth Title A Novel Defect Diagnosis Method for Kyropoulos Process Based Sapphire Growth Author Zhang, Wei (Taiyuan University of Technology) Qiao, Tiezhu (Taiyuan University of Technology) Pang, Y. (TU Delft Transport Engineering and Logistics) Yang, Yi (Taiyuan University of Technology) Chen, Hong (Shanxi Zhongjujingke Semiconductor Co.) Hao, Guirong (Shanxi Zhongjujingke Semiconductor Co.) Date 2020 Abstract When sapphire crystal is prepared with Kyropoulos method, the necking-down growth process is a key stage. Sapphire growth defect is a big problem in this stage. However, diagnosing growth defects is subject to the interference of workers subjectivity and accuracy always goes down. To address the problem, a novel defect diagnosis method is proposed for necking-down growth process in this paper. Industrial CCD sensors replace eyes of skilled workers to observe in this method. A new Defect-Diagnosing Siamese network (DDSN) is used in this method. We use Siamese architecture to learn similarity through pairs of images. We use the deep separable convolution (DSC) into the DDSN to optimize running speed and model size. In experiment, dataset is acquired by industrial CCD sensors in the necking-down growth process. The accuracy of defect diagnosis can reach up to 94.5%. The method significantly improves the traditional way. Subject CCD sensorDefect-Diagnosing Siamese networkNecking-down processSapphire Growth Defects To reference this document use: http://resolver.tudelft.nl/uuid:dee3bd33-466b-4c42-9110-704abe4c0c60 DOI https://doi.org/10.1109/JSEN.2020.2969963 ISSN 1530-437X Source IEEE Sensors Journal, 20 (10), 5435-5441 Bibliographical note Accepted Author Manuscript Part of collection Institutional Repository Document type journal article Rights © 2020 Wei Zhang, Tiezhu Qiao, Y. Pang, Yi Yang, Hong Chen, Guirong Hao Files PDF 08972456_2.pdf 9.5 MB Close viewer /islandora/object/uuid:dee3bd33-466b-4c42-9110-704abe4c0c60/datastream/OBJ/view