Print Email Facebook Twitter Experimental Qualification of a Low-Noise Charge-Sensitive ROIC with Very High Time Resolution Title Experimental Qualification of a Low-Noise Charge-Sensitive ROIC with Very High Time Resolution Author Mohammad Zaki, A.R. (TU Delft Electronic Instrumentation) Nihtianova, S. (TU Delft Electronic Instrumentation) Date 2023 Abstract Small charge detection is used for a wide range of applications: advanced industrial process control, experimental physics and space instruments, and material testing and medical imaging. These applications give rise to the development of a wide variety of charge-sensitive readout integrated circuits (ROICs). The trend in the state-of-the-art systems is to design low-noise and low-power readout electronics with a low detection error rate and small silicon area occupation, allowing the pixelization of the detector area. This paper presents the methodology and the test setup for the challenging experimental characterization of a state-of-the-art, high time-resolution, low-noise, power-efficient, charge-sensitive ROIC intended for counting single particles detected by a silicon PIN detector. The ROIC is designed to detect charge portions as small as 160 aC, with 0.14 mW power consumption. For every charge pulse of the detector, the ROIC generates voltage signals with a peak amplitude of 29.45 mV, a rise time of 2.56 ns, and an SNR above 20. Detailed information about the operation principle of this ROIC, designed in TSMC 40-nm MS/RF CMOS technology, is reported in a previous publication. Subject readout integrated circuit ROICcharge-sensitive amplifierlow-noisepower-efficienthigh time-resolutionwidebanddata acquisitionpixel To reference this document use: http://resolver.tudelft.nl/uuid:f7d92caf-a3d0-4264-af57-625babc14b31 DOI https://doi.org/10.1109/ISIE51358.2023.10228077 Publisher IEEE, Piscataway Embargo date 2024-03-01 ISBN 979-8-3503-9972-1 Source Proceedings of the 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) Event 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), 2023-06-19 → 2023-06-21, Otaniemi campus of Aalto University, Helsinki, Finland Bibliographical note Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. Part of collection Institutional Repository Document type conference paper Rights © 2023 A.R. Mohammad Zaki, S. Nihtianova Files PDF Experimental_Qualificatio ... lution.pdf 844.72 KB Close viewer /islandora/object/uuid:f7d92caf-a3d0-4264-af57-625babc14b31/datastream/OBJ/view