Print Email Facebook Twitter Optical scattering properties of a nano-textured ZnO-silicon interface Title Optical scattering properties of a nano-textured ZnO-silicon interface Author Jäger, K. Schulte, K. Bittkau, K. Ermes, A.M. Zeman, M. Pieters, B.E. Faculty Electrical Engineering, Mathematics and Computer Science Department Electrical Sustainable Energy Date 2011-05-03 Abstract The scattering properties of transparent conductive oxide (TCO) layers are fundamentally related to the performance of thin film silicon solar cells. In this study we introduce an experimental technique to access light scattering properties at textured TCO-silicon interfaces. Therefore we prepared a sample with a polished microcrystalline silicon layer, which is deposited onto a rough TCO layer. We used the measured results to validate calculations obtained with rigorous diffraction theory, i.e. a numerical solution of Maxwell’s equations. Furthermore we evaluated four approximate models based on the scalar scattering theory and ray tracing and compared them to the rigorous diffraction theory. Subject scattering, surface-textured TCO, microcrystalline silicon, ZnO, FDTD, scalar scattering theory, ray tracing To reference this document use: http://resolver.tudelft.nl/uuid:0502f8f9-fd8e-4f0f-b6a2-b8440d98df96 DOI https://doi.org/10.1117/12.889943 Publisher SPIE ISSN 0277-786X Source https://doi.org/10.1117/12.889943 Source Proceedings of SPIE, 2011 vol. 8001 Part of collection Institutional Repository Document type conference paper Rights (c)2011 The Authors Files PDF 2011-8001jager.pdf 2.56 MB Close viewer /islandora/object/uuid:0502f8f9-fd8e-4f0f-b6a2-b8440d98df96/datastream/OBJ/view