Far-field beam pattern technique for high pointing accuracy characterization of GUSTO HEB mixer arrays

Title

Far-field beam pattern technique for high pointing accuracy characterization of GUSTO HEB mixer arrays

 Author

Silva, J. R. (SRON Netherlands Institute for Space Research; Rijksuniversiteit Groningen)
Yates, S.J.C. (TU Delft Tera-Hertz Sensing; SRON Netherlands Institute for Space Research)
Laauwen, W. (SRON Netherlands Institute for Space Research)
Finkel, M. (TU Delft QCD/DiCarlo Lab; SRON Netherlands Institute for Space Research)
Gao, J.R. (TU Delft ImPhys/Optics; SRON Netherlands Institute for Space Research; Kavli institute of nanoscience Delft)

Date

2019

 To reference this document use:

http://resolver.tudelft.nl/uuid:0bf776e9-e77b-47f8-a2b8-ffb3b5ed1803

 Page numbers

185-185

 Event

2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019, 2019-04-15 → 2019-04-17, Gothenburg, Sweden

 Part of collection

Institutional Repository

 Document type

conference paper

 Rights

© 2019 J. R. Silva, S.J.C. Yates, W. Laauwen, M. Finkel, J.R. Gao
Files
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