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Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance
Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement
Failure quantitative assessment approach to MOSFET power device by detecting parasitic parameters
Effects of Thermal Reflowing Stress on Mechanical Properties of Novel SMT-SREKs
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