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Cui, Z. (author), Fan, Xuejun (author), Zhang, Kouchi (author)
In this paper, a recently developed theory - general coupling model of electromigration, is implemented in ANSYS. We first identify several errors provided in ANSYS manual for electromigration modeling. Then the general coupling model is implemented in ANSYS and the detailed description is presented. Finally, a 1-D confined metal line with a...
conference paper 2020