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Diware, S.S. (author), Chilakala, Koteswararao (author), Joshi, Rajiv V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)
Diabetic retinopathy (DR) is a leading cause of permanent vision loss worldwide. It refers to irreversible retinal damage caused due to elevated glucose levels and blood pressure. Regular screening for DR can facilitate its early detection and timely treatment. Neural network-based DR classifiers can be leveraged to achieve such screening in...
journal article 2024
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Condia, Josie E.Rodriguez (author), Augusto da Silva, F. (author), Bagbaba, Ahmet Cagri (author), Guerrero-Balaguera, Juan-David (author), Hamdioui, S. (author), Sauer, Christian (author), Sonza Reorda, Matteo (author)
Editor's notes: GPUs have seen an increased adoption in autonomous systems. This article assesses the fault coverage that can be attained through software self-test strategies for in-field test of GPUs. - Nicola Nicolici, McMaster University
journal article 2022
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Copetti, Thiago (author), Cardoso Medeiros, G. (author), Taouil, M. (author), Hamdioui, S. (author), Poehls, Leticia Bolzani (author), Balen, Tiago (author)
Fin Field-Effect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. Despite demonstrating improvements on short channel effect and overcoming the growing leakage problem of planar CMOS...
journal article 2021