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Li, Shizhen (author), Liu, X. (author), Gao, Chenshan (author), Wang, S. (author), Li, Jun (author), Ye, Huaiyu (author), Zhang, Kouchi (author), Wu, Shaohui (author)
The significance of wafer bonding is fundamental to the progression of electronic systems. Common fabrication techniques for Cu pillars play a crucial role in establishing resilient and efficient interconnects within semiconductor devices. It is imperative to explore the potential of nano-copper as an alternative material to overcome limitations...
conference paper 2024
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Ge, Wei (author), Jiao, Yutie (author), Wu, Meimei (author), Li, Zongkun (author), Wang, Te (author), Li, Wei (author), Zhang, Yadong (author), Gao, Weixing (author), van Gelder, P.H.A.J.M. (author)
Dam breaches often have catastrophic consequences in downstream areas. Hydrodynamic factors and the evacuation potential of the population at risk (PAR) have significant impacts on the loss of life (LOL) caused by dam breaches. However, the existing comprehensive evaluation models have not conducted in-depth research on the evacuation...
journal article 2022