A Deep Sub-Electron Temporal Noise CMOS Image Sensor with Adjustable sinc-type Filter to Achieve Photon Counting Capability

This letter introduces a Gm-cell-based CMOS image sensor (CIS) achieving deep subelectron noise performance. The CIS presents a new compensation block and low-noise current source to improve the performance of the Gm pixel. Furthermore, an optional first-order IIR filter is implemented to improve the output swing. The conversion gain, full...