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Righolt, C.H. (author), Mai, S. (author), Van Vliet, L.J. (author), Stallinga, S. (author)The quality of the reconstructed image in structured illumination microscopy (SIM) depends on various aspects of the image filtering process. To optimize the trade-off between resolution and ringing artifacts, which lead to negative intensities, we extend Lukosz-bound filtering to 3D SIM and derive the parametrization of the 3D SIM cut-off. We...journal article 2014