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Announcing TU Delft Repository replacement
On
2 July 2024
TU Delft Repository will be replaced with a fresh user friendly design with monthly new feature releases.
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EMC oxidation under high temperature aging
Degradation Estimation and Prediction of Electronic Packages using Data Driven Approach
In Situ Failure Detection of Electronic Control Units Using Piezoresistive Stress Sensor
Condition Monitoring Algorithm for Piezoresistive Silicon-Based Stress Sensor Data Obtained from Electronic Control Units
Prognostics and health monitoring of electronic system: A review
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